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Vicker’s microhardness of Bi1−x Sb x (x=0.05–0.30) crystals

Vicker’s microhardness of Bi1−x Sb x (x=0.05–0.30) crystals The solid–liquid interface of Bi1−x Sb x crystal growth is very favorable for investigations of electron–phonon phenomena. Bismuth is a semimetal with high electron and hole mobilities. When Bi is doped with Sb in the range of 7–22 atomic percentage, it undergoes semimetal–semiconductor transition. Interest in Bi–Sb materials system has recently been stimulated due to promise of a new generation of thermoelectric materials based on these alloys. The starting materials used in this study, Bi and Sb, were both of 99.999% purity. The authors have studied microhardness of these crystals with the above said composition range. The crystals were grown using Zone melting method with 0.35 cm/h growth speed and 25 zone passes. The indentation method is the most widely used method for measurement of hardness of the crystals either of metallic or nonmetallic nature. This method does not require large specimens and even on a small specimen a number of measurements can be carried out. Microhardness indentation tests were carried out on the cleavage planes (111) of the Bi1−x Sb x (x = 0.5 to 0.30) crystals, using the Vickers diamond pyramidal indenter. The results of Vickers microhardness studies on Bi1−x Sb x (x = 0.05, 0.10, 0.15, 0.20, 0.25, 0.30) are presented in this paper. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Materials Science Springer Journals

Vicker’s microhardness of Bi1−x Sb x (x=0.05–0.30) crystals

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References (12)

Publisher
Springer Journals
Copyright
Copyright © 2009 by Springer Science+Business Media, LLC
Subject
Materials Science; Materials Science, general; Characterization and Evaluation of Materials; Polymer Sciences; Continuum Mechanics and Mechanics of Materials; Crystallography and Scattering Methods; Classical Mechanics
ISSN
0022-2461
eISSN
1573-4803
DOI
10.1007/s10853-009-3470-3
Publisher site
See Article on Publisher Site

Abstract

The solid–liquid interface of Bi1−x Sb x crystal growth is very favorable for investigations of electron–phonon phenomena. Bismuth is a semimetal with high electron and hole mobilities. When Bi is doped with Sb in the range of 7–22 atomic percentage, it undergoes semimetal–semiconductor transition. Interest in Bi–Sb materials system has recently been stimulated due to promise of a new generation of thermoelectric materials based on these alloys. The starting materials used in this study, Bi and Sb, were both of 99.999% purity. The authors have studied microhardness of these crystals with the above said composition range. The crystals were grown using Zone melting method with 0.35 cm/h growth speed and 25 zone passes. The indentation method is the most widely used method for measurement of hardness of the crystals either of metallic or nonmetallic nature. This method does not require large specimens and even on a small specimen a number of measurements can be carried out. Microhardness indentation tests were carried out on the cleavage planes (111) of the Bi1−x Sb x (x = 0.5 to 0.30) crystals, using the Vickers diamond pyramidal indenter. The results of Vickers microhardness studies on Bi1−x Sb x (x = 0.05, 0.10, 0.15, 0.20, 0.25, 0.30) are presented in this paper.

Journal

Journal of Materials ScienceSpringer Journals

Published: Apr 20, 2009

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