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The use of Ols charge referencing for the X-ray photoelectron spectroscopy of Al/Si, AI/Ti and Al/Zr mixed oxides
A., Bhattacharya; D., Pyke; R., Reynolds; G., Walker; C., Werrett
Follow Journal of Materials Science , Volume 16 (1) Springer Journals – Jan 1, 1997
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- Title
- The use of Ols charge referencing for the X-ray photoelectron spectroscopy of Al/Si, AI/Ti and Al/Zr mixed oxides
- Author(s)
- A., Bhattacharya; D., Pyke; R., Reynolds; G., Walker; C., Werrett
- Journal
- Follow Journal of Materials Science , Volume 16 (1) Springer Journals – Jan 1, 1997
- Publisher
- Kluwer Academic Publishers
- Copyright
- Copyright © 1997 by Kluwer Academic Publishers
- Subject
- Chemistry; Polymer Sciences; Industrial Chemistry/Chemical Engineering; Characterization and Evaluation Materials; Mechanics
- ISSN
- 0022-2461
- eISSN
- 1573-4811
- D.O.I.
- 10.1023/A:1018521126248
- Publisher site
- Get PDF