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Quantitative X-ray phase analysis of surface layers

Quantitative X-ray phase analysis of surface layers

Abstract

The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X-rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations. The method was applied to the analysis of austenite distribution in cathodically charged stainless steel.
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