Subscribe to thousands of academic journals for just $40/month
Read and share the articles you need for your research, all in one place.

Quantitative X-ray phase analysis of surface layers

Journal of Applied Crystallography , Volume 17 (1): 18 – Feb 1, 1984

Details

Publisher
International Union of Crystallography
Copyright
Copyright (c) 1984 International Union of Crystallography
ISSN
0021-8898
D.O.I.
10.1107/S0021889884010931
Publisher site
See Article on Publisher Site

Preview Only

Expand Tray Hide Tray

Quantitative X-ray phase analysis of surface layers

Abstract

The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X-rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations. The method was applied to the analysis of austenite distribution in cathodically charged stainless steel.
Loading next page...

Preview Only. This article cannot be rented because we do not currently have permission from the publisher.

 
/lp/international-union-of-crystallography/quantitative-x-ray-phase-analysis-of-surface-layers-KU35kpuvy7