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Instrumental line shapes in neutron powder diffraction with focusing monochromators

Instrumental line shapes in neutron powder diffraction with focusing monochromators The optics of neutron powder diffractometers with bent-crystal monochromators is considered with respect to the computation of instrumental line shapes, accounting for second-order aberrations. A procedure of Monte Carlo simulation of instrumental line shapes has been developed. An analytical approximation of these shapes is described. Computational results for the case of the MURR diffractometer with position-sensitive detection and a focusing silicon monochromator are presented. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Applied Crystallography International Union of Crystallography

Instrumental line shapes in neutron powder diffraction with focusing monochromators

Journal of Applied Crystallography , Volume 33 (1): 137 – Feb 1, 2000

Instrumental line shapes in neutron powder diffraction with focusing monochromators

Journal of Applied Crystallography , Volume 33 (1): 137 – Feb 1, 2000

Abstract

The optics of neutron powder diffractometers with bent-crystal monochromators is considered with respect to the computation of instrumental line shapes, accounting for second-order aberrations. A procedure of Monte Carlo simulation of instrumental line shapes has been developed. An analytical approximation of these shapes is described. Computational results for the case of the MURR diffractometer with position-sensitive detection and a focusing silicon monochromator are presented.

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References (24)

Publisher
International Union of Crystallography
Copyright
Copyright (c) 2000 International Union of Crystallography
ISSN
0021-8898
eISSN
1600-5767
DOI
10.1107/S0021889899014454
Publisher site
See Article on Publisher Site

Abstract

The optics of neutron powder diffractometers with bent-crystal monochromators is considered with respect to the computation of instrumental line shapes, accounting for second-order aberrations. A procedure of Monte Carlo simulation of instrumental line shapes has been developed. An analytical approximation of these shapes is described. Computational results for the case of the MURR diffractometer with position-sensitive detection and a focusing silicon monochromator are presented.

Journal

Journal of Applied CrystallographyInternational Union of Crystallography

Published: Feb 1, 2000

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