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A two-crystal X-ray interferometer from different pieces of silicon material

A two-crystal X-ray interferometer from different pieces of silicon material It is shown that an X-ray interferometer consisting of two crystals cut from different pieces of silicon material can be successfully operated. The dependence of the visibility of the interference pattern on different thicknesses of beam splitter and analyzer is investigated. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Applied Crystallography International Union of Crystallography

A two-crystal X-ray interferometer from different pieces of silicon material

Journal of Applied Crystallography , Volume 18 (2): 120 – Apr 1, 1985

A two-crystal X-ray interferometer from different pieces of silicon material

Journal of Applied Crystallography , Volume 18 (2): 120 – Apr 1, 1985

Abstract

It is shown that an X-ray interferometer consisting of two crystals cut from different pieces of silicon material can be successfully operated. The dependence of the visibility of the interference pattern on different thicknesses of beam splitter and analyzer is investigated.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1985 International Union of Crystallography
ISSN
0021-8898
DOI
10.1107/S0021889885009931
Publisher site
See Article on Publisher Site

Abstract

It is shown that an X-ray interferometer consisting of two crystals cut from different pieces of silicon material can be successfully operated. The dependence of the visibility of the interference pattern on different thicknesses of beam splitter and analyzer is investigated.

Journal

Journal of Applied CrystallographyInternational Union of Crystallography

Published: Apr 1, 1985

There are no references for this article.