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A measuring procedure for single-crystal diffraction using synchrotron radiation

A measuring procedure for single-crystal diffraction using synchrotron radiation The use of synchrotron radiation (SR) for single-crystal diffraction measurements requires special features of both the instrumentation and the measuring procedure. This paper describes a new algorithm for data collection developed for synchrotron radiation. It has been used successfully at the five-circle diffractometer at HASYLAB (DESY, Hamburg). The main features are: precise location of the reflection position, determination of the measuring parameters by pre-scanning, subsequent fine scanning, and real-time monitoring of several parameters of the beam conditions for data reduction. This allows fast and precise data collection. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Applied Crystallography International Union of Crystallography

A measuring procedure for single-crystal diffraction using synchrotron radiation

Journal of Applied Crystallography , Volume 22 (4): 382 – Aug 1, 1989

A measuring procedure for single-crystal diffraction using synchrotron radiation

Journal of Applied Crystallography , Volume 22 (4): 382 – Aug 1, 1989

Abstract

The use of synchrotron radiation (SR) for single-crystal diffraction measurements requires special features of both the instrumentation and the measuring procedure. This paper describes a new algorithm for data collection developed for synchrotron radiation. It has been used successfully at the five-circle diffractometer at HASYLAB (DESY, Hamburg). The main features are: precise location of the reflection position, determination of the measuring parameters by pre-scanning, subsequent fine scanning, and real-time monitoring of several parameters of the beam conditions for data reduction. This allows fast and precise data collection.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1989 International Union of Crystallography
ISSN
0021-8898
eISSN
1600-5767
DOI
10.1107/S0021889889000610
Publisher site
See Article on Publisher Site

Abstract

The use of synchrotron radiation (SR) for single-crystal diffraction measurements requires special features of both the instrumentation and the measuring procedure. This paper describes a new algorithm for data collection developed for synchrotron radiation. It has been used successfully at the five-circle diffractometer at HASYLAB (DESY, Hamburg). The main features are: precise location of the reflection position, determination of the measuring parameters by pre-scanning, subsequent fine scanning, and real-time monitoring of several parameters of the beam conditions for data reduction. This allows fast and precise data collection.

Journal

Journal of Applied CrystallographyInternational Union of Crystallography

Published: Aug 1, 1989

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