Editor-in-Chief:
A. Kugi
Automation and Control Institute
Vienna University of Technology,
Gusshausstr. 27-29 376, 1040 Vienna,
Austria
Deputy Editor-in-Chief:
B. Huang
Department of Chemical and Materials Engineering
University of Alberta
Edmonton, AB
Canada T6G 2R3
Control Engineering Practice
E.F. Camacho
Escuela Superior Ingenieros,
Avda Reina Mercedes,
E-41012 Sevilla, Spain.,
Email: eduardo@cartuja.us.es
I.K. Craig
Department of Electrical, Electronic &
Computer Engineering, University of Pretoria,
Pretoria 0002, South Africa,
Email: icraig@postino.up.ac.za
T. Hagglund
Department of Automatic Control, Lund Institute of
Technology, Box 118, SE-22100 Lund,
Sweden,
Email: tore@control.lth.se
D. Hrovat
Ford Motor Company, Scientifi c Res Lab, Rm
E-1170, PO Box 2053, Dearborn, MI 48121, USA.,
Email: dhrovat@ford.com
D.G. Hulbert
Mintek, Private Bag X3015, Randburg,
2125 South Africa., Fax: +27 11 793 1606,
Email: daveh@mintek.co.za
G.W. Irwin
Department of Electrical and Electronic Engineering,
Queen’s University of Belfast, Belfast BT9 5AH, UK,
Email: g.irwin@ee.qub.ac.uk
T.H. Lee
Department of Electrical Engineering,
The National University of Singapore, 10 Kent Ridge
Crescent S, 119260 Singapore.,
Email: eleleeth@nus.edu.sg
A. Sciarretta
IFP, 1-4, av Bois Préau,
Rueil Malmaison, 92500, France,
E-mail: Antonio.SCIARRETTA@ifp.fr
Y. Xi
Department of Automation,
Shanghai Jiao Tong University,
Shanghai, 200240,
People’s Republic of China,
Email: ygxi@sjtu.edu.cn
J. Zaytoon
Université de Reims Champagne Ardenne,
Reims Cedex, France,
Email: janan.zaytoon@univ-reims.fr
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Associate Editors:
P. Albertos
Universidad Politecnica Valencia, Spain
C. Aldrich
University of Stellenbosch, South Africa
A. Alleyne
University of Illinois Urbana-Champaign,
USA
F. Assadian
Cranfi eld University, Cranfi eld, UK
C. Batlle
Universitat Politècnica de Catalunya, Spain
B. Chaudhuri
Imperial College London, UK
G. Chiu
Purdue University, USA
M.H. Costin
General Motors Corp., Global Vehicle
Engineering, Warren, MI, USA
S. Daley
University of Sheffi eld, UK
F. Delli Priscoli
University of Rome, Italy
A. Desbiens
Universite Laval, Canada
L. Eriksson
Linköping University, Sweden
P. Falcone
Chalmers University of Technology, Sweden
D. Feng
University of Sydney, Australia
M. Gilson Bagrel
Recherche en Automatique de Nancy
(CRAN), France
F. Giri
University of Caen Basse-Normandie, France
A. Glumineau
IRCCyN / ECN, France
D. Gu
University of Leicester, Leicester, UK.
T. Hamel
Universite de Nice Sophia Antipolis,
France
J. Hahn
Texas A&M University, USA
V. Havlena
Honeywell Prague, Czech Republic
K. Hoo
Texas Tech University, USA
A. Horch
ABB Research Centre, Ladenburg,
Germany
T. Kawabe
Kyushu University, Japan
E. Kerrigan
Imperial College, London, UK
R. King
Technische Universität Berlin, Germany
M. Kinnaert
Université Libre de Bruxelles, Belgium
P. Korba
ABB Corporate Research Ltd., Switzerland
X. Li
Fundan University, Shanghai, China
G. Lightbody
University of Cork, Eire
S. Liu
University of Kaiserslautern, Germany
S. Longhi
Università Politecnica delle Marche,
Italy
J. Lu
Ford Motor Company, Michigan, USA
A. Lynch
University of Alberta, Canada
G. Magnani
Politecnico di Milano, Italy
O.P. Malik
University of Calgary, Canada
I. Mareels
University of Melbourne, Australia
C. Melchiorri
University of Bologna, Italy
L. Menini
Universita di Roma, Italy
T. Meurer
Vienna University of Technology, Austria
T. Morton
Econnect Australia Pty Ltd, Melbourne,
Australia
Z. Nagy
Loughborough University, UK
J.E. Normey-Rico
Universidade Federal de Santa Catarina,
Brazil
A. Pashkevich
University of Technology of Troyes, France
L.-F. Pau
Ericsson S.A., Mougins, France
C.E. Pereira
Universidade Federal do Rio Grande do Sul,
Brazil
M.-N. Pons
CNRS-ENSIC-INPL, Nancy, France
C-A Rabbath
DRDC - Valcartier, Quebec City, Canada
N.L. Ricker
University of Washington, USA
G. Rizzo
Università di Salerno, Italy
J.Z. Sasiadek
Carleton University, Canada
S. Savaresi
Politecnico di Milano, Italy
O. Sawodny
University of Stuttgart, Germany
G. Schitter
TU Wien, Austria
K. Schlacher
Johannes Kepler University of Linz,
Austria
P. Seiler
University of Minnesota, Minneapolis,
MN, USA
G.M. Shaver
Purdue University, USA
X. Shen
The University of Alabama, USA
H. Siguerdidjane
Supelec, France
W.H. Steyn
University of Stellenbosch, South Africa
J.D. Stigter
Wageningen University, The Netherlands
C.-Y. Su
University of Montreal, Quebec,
Canada
M. Sumner
The University of Nottingham, UK
A. Tayebi
Lakehead University, Canada
N. Thornhill
Imperial College, London, UK
W. Wang
Dalian University of Technology,
Dalian, China
J. Yu
McMaster University, Hamilton, ON,
Canada
Editorial Board
Editors: