Search

Filter

  • Advanced Filters:

  • to
  • Specific Data Sources:

    All Edit

    Select All  |  Select None

Reset filters

Transient faults due to neutron and alpha particle strikes posea significant obstacle to increasing processor transistor counts infuture technologies. Although fault rates of individual transistorsmay not rise significantly, incorporating more transistors into adevice makes that device more likely to encounter a fault. Hence,maintaining processor error rates at acceptable levels will requireincreasing design effort.This paper proposes two simple approaches to reduce errorrates and evaluates their application to a microprocessor instructionqueue. The first technique reduces the time instructions sit invulnerable storage structures by selectively squashing instructionswhen long delays are encountered. A fault is less likely to cause anerror if the structure it affects does not contain valid instructions.We introduce a new metric, MITF (Mean Instructions To Failure),to capture the trade-off between performance and reliability introducedby this approach.The second technique addresses false detected errors. In theabsence of a fault detection mechanism, such errors would nothave affected the final outcome of a program. For example, a faultaffecting the result of a dynamically dead instruction would notchange the final program output, but could still be flagged by thehardware as an error. To avoid signalling such false errors, wemodify a pipeline's error detection logic to mark affected instructionsand data as possibly incorrect rather than immediately signalingan error. Then, we signal an error only if we determine laterthat the possibly incorrect value could have affected the program'soutput.

End of preview. The entire article is 12 pages. To view the full-text, please rent this article to continue.

/lp/association-for-computing-machinery/techniques-to-reduce-the-soft-error-rate-of-a-high-performance-janTb1AvHh
Welcome to DeepDyve! Rent Premier Research Articles and Save Up to 90%

Learn more

Bookmark

Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor

Weaver, Christopher; Emer, Joel; Mukherjee, Shubhendu S.; Reinhardt, Steven K.
ACM SIGARCH Computer Architecture News , Volume 32 (2)
Association for Computing MachineryMar 2, 2004

More Info

More Like This Article

View All dataSource[]=actageo&dataSource[]=aspet&dataSource[]=aaos&dataSource[]=aacc&dataSource[]=aacr&dataSource[]=aea&dataSource[]=aip&dataSource[]=ajnr&dataSource[]=ams&dataSource[]=aps_physical&dataSource[]=appi_book&dataSource[]=appi_journal&dataSource[]=apha&dataSource[]=asip&dataSource[]=asm&dataSource[]=asn&dataSource[]=aspb&dataSource[]=avs&dataSource[]=annual_reviews&dataSource[]=arxiv&dataSource[]=acm&dataSource[]=berghahn&dataSource[]=cabi&dataSource[]=clinical_trials&dataSource[]=dailymed&dataSource[]=degruyter&dataSource[]=du_press&dataSource[]=esa&dataSource[]=eu_press&dataSource[]=elsevier&dataSource[]=emerald&dataSource[]=ejtr&dataSource[]=emea&dataSource[]=epo&dataSource[]=faseb&dataSource[]=gsa&dataSource[]=health_affairs&dataSource[]=hindawi&dataSource[]=imanager&dataSource[]=imedpub&dataSource[]=informa_healthcare&dataSource[]=informs&dataSource[]=iop&dataSource[]=iucr&dataSource[]=iospress&dataSource[]=jbjs&dataSource[]=leftcoast&dataSource[]=lu_press&dataSource[]=mesharpe&dataSource[]=mary_ann_liebert&dataSource[]=medline&dataSource[]=mit_press&dataSource[]=nature&dataSource[]=oxford&dataSource[]=pier_professional&dataSource[]=pnas&dataSource[]=portlandpress&dataSource[]=psyc_articles&dataSource[]=psyc_books&dataSource[]=psyc_critiques&dataSource[]=plos_journal&dataSource[]=pubmed_central&dataSource[]=rsna&dataSource[]=rockefeller&dataSource[]=rcn&dataSource[]=ria&dataSource[]=rsc&dataSource[]=sage&dataSource[]=spie&dataSource[]=springer_journal&dataSource[]=springer&dataSource[]=taylor_francis&dataSource[]=aps&dataSource[]=the_scientist&dataSource[]=uc_press&dataSource[]=uspto_abstract&dataSource[]=wiley&dataSource[]=pct

Browse: Subject Areas | Journals | Publishers

Sign Up for a DeepDyve Account

Bookmark an Article

To bookmark an article, please log in first, or sign up for a DeepDyve account if you don't already have one.

OK

Subscribe to Journal Email Alerts

To subscribe to email alerts, please log in first, or sign up for a DeepDyve account if you don't already have one.

OK

Thank you for renting with DeepDyve

Your PayPal account has been charged $2.99. You now have access to the full text of this article. A rental receipt has also been sent to your email address.

Your credit card has been charged $2.99. You now have access to the full text of this article. A rental receipt has also been sent to your email address.

OK

New! You can now keep track of new articles from ACM SIGARCH Computer Architecture News on your personalized homepage! Learn more

PDF Download — Not Available

Thanks for your interest in purchasing the PDF. Your request has been noted and we will work with our publisher partner to discuss enabling this feature.

In the meantime, you can get the PDF by visiting the publisher site.

Thank you for purchasing with DeepDyve

Your PayPal account has been charged $.

Your credit card has been charged $.

You can now download this article. A purchase receipt has also been sent to your email address.

Download This Article or I'm done with my download

Print Page — Not Available

Thanks for your interest in printing individual pages. Your request has been noted and we will work with our publisher partner to discuss enabling this feature.

In the meantime, you can get the PDF by visiting the publisher site.

Thank you for printing with DeepDyve

Your PayPal account has been charged $0.

Your credit card has been charged $0.

You can now print this article. A purchase receipt has also been sent to your email address.

Print the Selected Pages or I'm done with my printing

Please refresh to generate a new download link

Your article download link has expired. Please refresh this page to obtain a new download link and try again.

Follow a Journal

To get new article updates from a journal on your personalized homepage, please log in first, or sign up for a DeepDyve account if you don't already have one.

OK