Search

Filter

  • Advanced Filters:

  • to

  • Specific Data Sources:

    All Edit

    Select All  |  Select None

Reset filters

Journals ACM SIGCHI Bulletin Volume 30 Issue 4

Incorporating Work, ProcessAnd Task Analysis Into CommercialAnd Industrial Object-Oriented Systems Development A CHI 98 Workshop John Artim, Mark van Harmelen, Keith Butler, Jan Gulliksen, Austin Henderson, Srdjan Kovacevic, Shijian Lu, Scott Overmyer, Ray Reaux, Dave Roberts, Jean-Claude Tarby and Keith Vander Linden Abstract In this paper, we report on the results of the CHI98 workshop on task, process and work analysis coupled with object modeling. This workshop was aJ~llow-up to a CHI97 workshop of the same topic. This year} workshop took as its starting point the summary paper and j~amework created in last year} workshop. The goal of this year} workshop was to bridge the conceptual gulf between current H C I practice and current devdopment practice. The result of this workshop is a proposed set of extensions to UML, a key standard in the object-oriented development communily. Keyw0rds Task Analysis, Process Analysis, Object Modeling, Use Case Modeling, User Interface Design, U M L interface and system development work. The highlights of this framework include the following points: The users of a system under design work in a world of existing tasks and referents. The various participants in the design process make use of one or more descriptions

End of preview. The entire article is 4 pages. To view the full-text, please rent this article to continue.

/lp/association-for-computing-machinery/incorporating-work-process-and-task-analysis-into-commercial-and-zw4h9E0iL0
Welcome to DeepDyve! Rent Premier Research Articles and Save Up to 90%

Learn more

Bookmark

Incorporating work, process and task analysis into commercial and industrial object-oriented systems development

More Info

More Like This Article

View All dataSource[]=actageo&dataSource[]=aspet&dataSource[]=aaos&dataSource[]=aacc&dataSource[]=aacr&dataSource[]=aea&dataSource[]=aip&dataSource[]=ajnr&dataSource[]=ams&dataSource[]=aps_physical&dataSource[]=appi_book&dataSource[]=appi_journal&dataSource[]=apha&dataSource[]=asip&dataSource[]=asm&dataSource[]=asn&dataSource[]=aspb&dataSource[]=avs&dataSource[]=annual_reviews&dataSource[]=arxiv&dataSource[]=acm&dataSource[]=berghahn&dataSource[]=cabi&dataSource[]=clinical_trials&dataSource[]=dailymed&dataSource[]=degruyter&dataSource[]=du_press&dataSource[]=esa&dataSource[]=eu_press&dataSource[]=elsevier&dataSource[]=emerald&dataSource[]=ejtr&dataSource[]=emea&dataSource[]=epo&dataSource[]=faseb&dataSource[]=gsa&dataSource[]=health_affairs&dataSource[]=hindawi&dataSource[]=imanager&dataSource[]=imedpub&dataSource[]=informa_healthcare&dataSource[]=informs&dataSource[]=iop&dataSource[]=iucr&dataSource[]=iospress&dataSource[]=jbjs&dataSource[]=leftcoast&dataSource[]=lu_press&dataSource[]=mesharpe&dataSource[]=mary_ann_liebert&dataSource[]=medline&dataSource[]=mit_press&dataSource[]=nature&dataSource[]=oxford&dataSource[]=pier_professional&dataSource[]=pnas&dataSource[]=portlandpress&dataSource[]=psyc_articles&dataSource[]=psyc_books&dataSource[]=psyc_critiques&dataSource[]=plos_journal&dataSource[]=pubmed_central&dataSource[]=rsna&dataSource[]=rockefeller&dataSource[]=rcn&dataSource[]=ria&dataSource[]=rsc&dataSource[]=sage&dataSource[]=spie&dataSource[]=springer_journal&dataSource[]=springer&dataSource[]=taylor_francis&dataSource[]=aps&dataSource[]=the_scientist&dataSource[]=uc_press&dataSource[]=uspto_abstract&dataSource[]=wiley&dataSource[]=pct

Browse: Subject Areas | Journals | Publishers

Sign Up for a DeepDyve Account

Bookmark an Article

To bookmark an article, please log in first, or sign up for a DeepDyve account if you don't already have one.

OK

Subscribe to Journal Email Alerts

To subscribe to email alerts, please log in first, or sign up for a DeepDyve account if you don't already have one.

OK

Thank you for renting with DeepDyve

Your PayPal account has been charged $2.99. You now have access to the full text of this article. A rental receipt has also been sent to your email address.

Your credit card has been charged $2.99. You now have access to the full text of this article. A rental receipt has also been sent to your email address.

OK

New! You can now keep track of new articles from ACM SIGCHI Bulletin on your personalized homepage! Learn more

PDF Download — Not Available

Thanks for your interest in purchasing the PDF. Your request has been noted and we will work with our publisher partner to discuss enabling this feature.

In the meantime, you can get the PDF by visiting the publisher site.

Thank you for purchasing with DeepDyve

Your PayPal account has been charged $.

Your credit card has been charged $.

You can now download this article. A purchase receipt has also been sent to your email address.

Download This Article or I'm done with my download

Print Page — Not Available

Thanks for your interest in printing individual pages. Your request has been noted and we will work with our publisher partner to discuss enabling this feature.

In the meantime, you can get the PDF by visiting the publisher site.

Thank you for printing with DeepDyve

Your PayPal account has been charged $0.

Your credit card has been charged $0.

You can now print this article. A purchase receipt has also been sent to your email address.

Print the Selected Pages or I'm done with my printing

Please refresh to generate a new download link

Your article download link has expired. Please refresh this page to obtain a new download link and try again.

Follow a Journal

To get new article updates from a journal on your personalized homepage, please log in first, or sign up for a DeepDyve account if you don't already have one.

OK