Leakage power is dominated by critical paths, and hence dynamic deactivation of fast transistors can yield large savings. We introduce metrics for comparing fine-grain dynamic deactivation techniques that include the effects of deactivation energy and startup latencies, as well as long-term leakage current. We present a new circuit-level technique for leakage current reduction, leakage-biased bitlines, that has low deactivation energy and fast wakeup times. We show how this technique can be applied at a fine grain within an active microprocessor, and how microarchitectural scheduling policies can improve its performance. Using leakage-biased bitlines to deactivate SRAM read paths within I-cache memories saves over 24% of leakage energy and 22% of total I-cache energy when using a 70nm process. In the register file, fine-grained read port deactivation saves nearly 50% of leakage energy and 22% of total energy. Independently, turning off idle register file subbanks saves over 67% of leakage energy (57% total register file energy) with no loss in performance.
End of preview. The entire article is 11 pages. To view the full-text, please rent this article to continue.
/lp/association-for-computing-machinery/dynamic-fine-grain-leakage-reduction-using-leakage-biased-bitlines-zYhgeMNhzZ
Welcome to DeepDyve! Rent Premier Research Articles and Save Up to 90%
Dynamic fine-grain leakage reduction using leakage-biased bitlines
Heo, Seongmoo; Barr, Kenneth; Hampton, Mark; Asanović, Krste
Follow ACM SIGARCH Computer Architecture News
, Volume 30 (2)
Association for Computing Machinery – May 1, 2002
More Info
More Like This Article
View All dataSource[]=actageo&dataSource[]=aspet&dataSource[]=aaos&dataSource[]=aacc&dataSource[]=aacr&dataSource[]=aea&dataSource[]=aip&dataSource[]=ajnr&dataSource[]=ams&dataSource[]=aps_physical&dataSource[]=appi_book&dataSource[]=appi_journal&dataSource[]=apha&dataSource[]=asip&dataSource[]=asm&dataSource[]=asn&dataSource[]=aspb&dataSource[]=avs&dataSource[]=annual_reviews&dataSource[]=arxiv&dataSource[]=acm&dataSource[]=berghahn&dataSource[]=cabi&dataSource[]=clinical_trials&dataSource[]=dailymed&dataSource[]=degruyter&dataSource[]=du_press&dataSource[]=esa&dataSource[]=eu_press&dataSource[]=elsevier&dataSource[]=emerald&dataSource[]=ejtr&dataSource[]=emea&dataSource[]=epo&dataSource[]=faseb&dataSource[]=gsa&dataSource[]=health_affairs&dataSource[]=hindawi&dataSource[]=imanager&dataSource[]=imedpub&dataSource[]=informa_healthcare&dataSource[]=informs&dataSource[]=iop&dataSource[]=iucr&dataSource[]=iospress&dataSource[]=jbjs&dataSource[]=leftcoast&dataSource[]=lu_press&dataSource[]=mesharpe&dataSource[]=mary_ann_liebert&dataSource[]=medline&dataSource[]=mit_press&dataSource[]=nature&dataSource[]=oxford&dataSource[]=pier_professional&dataSource[]=pnas&dataSource[]=portlandpress&dataSource[]=psyc_articles&dataSource[]=psyc_books&dataSource[]=psyc_critiques&dataSource[]=plos_journal&dataSource[]=pubmed_central&dataSource[]=rsna&dataSource[]=rockefeller&dataSource[]=rcn&dataSource[]=ria&dataSource[]=rsc&dataSource[]=sage&dataSource[]=spie&dataSource[]=springer_journal&dataSource[]=springer&dataSource[]=taylor_francis&dataSource[]=aps&dataSource[]=the_scientist&dataSource[]=uc_press&dataSource[]=uspto_abstract&dataSource[]=wiley&dataSource[]=pct
© 2012 DeepDyve, Inc. All rights reserved.
Terms of Service | Privacy Policy
