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. This is further confirmed via x - ray diffraction pole figures that determine the epitaxial registry between the thin film and substrate. We further investigate the microscopic structure of thin films via Raman ...
For the rapid structural characterization of combinatorial epitaxial thin films , we developed an X - ray diffraction system. A convergent X - ray beam from a curved crystal monochromator is focused ...
deposited on MgO(001) by molecular beam epitaxy . Film compositions were chosen to vary the lattice mismatch with MgO. The film structure was investigated by x - ray diffraction (XRD), Rutherford backscattering ...
microscopy (SEM) and energy dispersive X - ray spectroscopy (EDS) indicate full coverage of LaMnO3 on the substrate. X - ray diffraction in the symmetric ω/2θ mode suggests the film has an out-of-plane ...
was determined by Rutherford backscattering spectroscopy and X - ray fluorescence analysis. X - ray diffraction analyses confirmed that the thin film grown epitaxially and the lattice constant decreasing as x ...
(111)B substrates by molecular beam epitaxy . Film thickness from a single monolayer (ML) up to 30 ML is demonstrated. Structural and chemical studies using by x - ray diffraction , transmission electron ...
presents a challenge to the use of x - ray diffraction (XRD) analysis with conventional Bragg–Brentano geometry in analyzing the crystallinity and epitaxial orientation of 2D films . To circumvent this problem ...
The technique of reciprocal space mapping using X ‐ rays is a recognized tool for the nondestructive characterization of epitaxial films . X ‐ ray scattering from epitaxial Si0.4Ge0.6 films on Si(100 ...
suggested during the MOD process. A characterization of specimens was performed using X - ray diffraction θ–2θ scans, out-of-plane and in-plane scans, X - ray photoelectron spectroscopy, electron backscattering ...
We report the structural and magnetic characterization of sputter deposited epitaxial Ho. We present room temperature characterization by atomic force microscopy and x - ray diffraction and temperature ...
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