Experimental aspects of dissipation force microscopy
Experimental aspects of dissipation force microscopy
Loppacher, C; Bennewitz, R; Pfeiffer, O; Guggisberg, M; Bammerlin, M; Schär, S; Barwich, V; Baratoff, A; Meyer, E
2000-11-15 00:00:00
Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed, and the role of the atomic constitution of the tip for quantitative results is pointed out.
http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.pngPhysical Review BAmerican Physical Society (APS)http://www.deepdyve.com/lp/american-physical-society-aps/experimental-aspects-of-dissipation-force-microscopy-gkP0SFzAd0
Experimental aspects of dissipation force microscopy
Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed, and the role of the atomic constitution of the tip for quantitative results is pointed out.
Journal
Physical Review B
– American Physical Society (APS)
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