Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Experimental aspects of dissipation force microscopy

Experimental aspects of dissipation force microscopy Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed, and the role of the atomic constitution of the tip for quantitative results is pointed out. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Physical Review B American Physical Society (APS)

Experimental aspects of dissipation force microscopy

6 pages

Loading next page...
 
/lp/american-physical-society-aps/experimental-aspects-of-dissipation-force-microscopy-gkP0SFzAd0

References

References for this paper are not available at this time. We will be adding them shortly, thank you for your patience.

Publisher
American Physical Society (APS)
Copyright
Copyright © 2000 The American Physical Society
ISSN
1095-3795
DOI
10.1103/PhysRevB.62.13674
Publisher site
See Article on Publisher Site

Abstract

Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed, and the role of the atomic constitution of the tip for quantitative results is pointed out.

Journal

Physical Review BAmerican Physical Society (APS)

Published: Nov 15, 2000

There are no references for this article.