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Critical sheet resistance observed in high- T c oxide-superconductor Nd 2 - x Ce x CuO 4 thin films

Critical sheet resistance observed in high- T c oxide-superconductor Nd 2 - x Ce x CuO 4 thin films High- T c oxide-superconductor Nd 2 - x Ce 3 CuO 4 single-crystal thin films were used to observe the critical sheet resistance at the insulator-superconductor transition. The films were epitaxially grown on SrTiO 3 (100) by the method of molecular-beam epitaxy. The electron transport properties of these films are drastically influenced by oxygen-impurity concentration and show clearly the evidence of Anderson localization attributed to two dimensionality. It is found that the critical sheet resistance R □ at the onset of superconductivity takes a value within a range from 6 to 8 kΩ, which is close to the value h /4 e 2 =6.45 kΩ. Our results provide clear evidence that Anderson localization induces the universal behavior observed at the supercondutor-insulator transition. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Physical Review B American Physical Society (APS)

Critical sheet resistance observed in high- T c oxide-superconductor Nd 2 - x Ce x CuO 4 thin films

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Publisher
American Physical Society (APS)
Copyright
Copyright © 1991 The American Physical Society
ISSN
1095-3795
DOI
10.1103/PhysRevB.43.8725
Publisher site
See Article on Publisher Site

Abstract

High- T c oxide-superconductor Nd 2 - x Ce 3 CuO 4 single-crystal thin films were used to observe the critical sheet resistance at the insulator-superconductor transition. The films were epitaxially grown on SrTiO 3 (100) by the method of molecular-beam epitaxy. The electron transport properties of these films are drastically influenced by oxygen-impurity concentration and show clearly the evidence of Anderson localization attributed to two dimensionality. It is found that the critical sheet resistance R □ at the onset of superconductivity takes a value within a range from 6 to 8 kΩ, which is close to the value h /4 e 2 =6.45 kΩ. Our results provide clear evidence that Anderson localization induces the universal behavior observed at the supercondutor-insulator transition.

Journal

Physical Review BAmerican Physical Society (APS)

Published: Apr 1, 1991

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