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We have measured the upper critical field H c 2 ( θ ) for extreme type-II granular aluminum films much thicker than the coherence length and have found them to display a strong temperature-dependent anisotropy ( H ∥ H ⊥ ≫ 1 ). The temperature dependence of the parallel critical field, H ∥ ( T ) , shows an infinite slope near T c , which we interpret as an indication that these films have a layered structure. The perpendicular critical field, H ⊥ ( T ) , has an upward curvature, reminiscent of the behavior observed in ( SN ) x and some layered compounds. As a result, the anisotropy ratio decreases strongly as the temperature is lowered. We interpret this behavior as a transition towards zero dimensionality (decoupled grains). We have also measured the fluctuation conductivity σ s above T c . We find that, for films with high values of normal-state resistivity, σ s follows a power law characteristic of zero dimensionality far above T c , and characteristic of two dimensionality closer to T c , in agreement with the proposed interpretation of the critical-field data.
Physical Review B – American Physical Society (APS)
Published: Nov 1, 1977
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