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rough PS layers that are essentially formed of interconnected cluster‐like structures . Optical investigations indicate that this surface roughness enables the PS layers to be used as antireflection ...
and the evolution of surface roughness . In this study, we have investigated temporal evolution of silicon surface topography under 500-eV argon ion bombardment for two angles of incidence, namely 70° and 72.5 ...
–rutile mixed phase at 100 W. The thickness, roughness , and mass density of the thin films were measured using X‐ray reflectivity . It was observed that for Ts films, the roughness and mass density increased ...
of sidewall roughness was done by AFM and by optical interferometry. Geometrical parameters of structures were measured by SEM. It was observed that roughness of inner sidewalls of etched structures does ...
network connected with an outdiffusion of oxygen and an increase of the surface roughness are observed . Depending on sublayer thickness, the onset of the formation of Ge nanocrystals is observed around 700 ...
An X-ray reflectivity (XR) study of the dynamic evolutionof the film surface was carried out for molybdenum (Mo) sputter-depositedonto silicon substrates. The Mo-air interface widthgrows with time ...
AbstractThis paper presents the results of study on titanium dioxide thin films prepared by atomic layer deposition method on a silicon substrate. The changes of surface morphology have been observed ...
The Fresnel reflections occurring at the interfaces of a silicon wafer shall be drastically reduced by reactive ion beam etching of so called moth-eye structures into both surfaces of the wafer ...
and Scanning Electron Microscope (SEM). Its roughness is ~ 10 nm and wave-liked structures were locally observed on the film surface . In order to investigate electromechanical performance of the film, sandwich ...
for the stabilization of the porous layer width. The photoluminescence and reflectance results correlate well with the morphology data (i.e. the surface roughness and the lateral nanometer size of the imaged structures ...
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