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The strain distribution of a lateral nanostructure containing an InGaAs single quantum well (SQW) is studied by depth-resolved high-resolution x-ray grazing - incidence diffraction . The lateral strain ...
Lateral strain modulations in a Si substratearising from laterally patterned periodic SiO2 stripes wereinvestigated by x-ray grazing incidence diffraction . In thisdiffraction geometry a depth ...
implantation of 5 × 10 cm ions. We studied the strain distribution in the samples before and after a rapid thermal annealing for 60 s at 650 and 800 C by means of x-ray grazing incidence diffraction ...
, the individual incident rays of different angles within the coherent convergent nanoprobe can interfere with each other; the diffraction of the coherent beam by the specimen and the interference among the incident ...
behaviors of the three acceptors (M2, M36 and M38) in neat films, grazing - incidence wide-angle X-ray scattering (GIWAXS) measurements were carried out (Fig. 2a and b, Supplementary Table S2). All three ...
, Spatial analysis , Acoustic properties, Guided waves, Wave scattering and diffraction 1 INTRODUCTION Research conducted across the 1990s on structured materials for both electromagnetic and mechanical waves ...
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