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Characterization of ferroelectricity in metal/ferroelectric/insulator/semiconductor structure by pulsed C–V measurement; Ferroelectricity in YMnO 3 /Y 2 O 3 /Si YMnO 3 /Y 2 O 3 /Si structure

Journal of Applied Physics , Volume 87 (7) – Apr 1, 2000

Details

Publisher
American Institute of Physics
Copyright
Copyright © 2000 American Institute of Physics
ISSN
0021-8979
eISSN
1089-7550
D.O.I.
10.1063/1.372364
Publisher site
See Article on Publisher Site
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