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Journals Review of Scientific Instruments Volume 83 Issue 2

A broadband microwave spectrometer has been constructed to determine the complex conductivity of thin metal films at frequencies from 45 MHz to 20 GHz working in the temperature range from 0.45 K to 2 K (in a 3 He cryostat). The setup follows the Corbino approach: a vector network analyzer measures the complex reflection coefficient of a microwave signal hitting the sample as termination of a coaxial transmission line. As the calibration of the setup limits the achievable resolution, we discuss the sources of error hampering different types of calibration. Test measurements of the complex conductivity of a heavy-fermion material demonstrate the applicability of the calibration procedures.

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Broadband microwave spectroscopy in Corbino geometry at 3 He temperatures

Steinberg, Katrin; Scheffler, Marc; Dressel, Martin
Review of Scientific Instruments , Volume 83 (2)
American Institute of Physics – Feb 1, 2012

More Info
  • Publisher American Institute of Physics
  • Copyright Copyright © 2012 American Institute of Physics
  • ISSN 0034-6748
  • eISSN 1089-7623
  • D.O.I. 10.1063/1.3680576
  • Publisher site Get PDF  

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