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ADDENDUM: “Nonreciprocal differential detection method for scanning Kerr-effect microscopy” J. Appl. Phys. 81 , 5015 (1997)

Silva, T. J.; Kos, A. B.
Journal of Applied Physics , Volume 82 (11) American Institute of PhysicsDec 1, 1997
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Title
ADDENDUM: “Nonreciprocal differential detection method for scanning Kerr-effect microscopy” J. Appl. Phys. 81 , 5015 (1997)
Author(s)
Silva, T. J.; Kos, A. B.
Journal
Journal of Applied Physics , Volume 82 (11) American Institute of Physics – Dec 1, 1997
Publisher
American Institute of Physics
Copyright
Copyright © 1997 American Institute of Physics
ISSN
0021-8979
eISSN
1089-7550
D.O.I.
10.1063/1.366406
Publisher site
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