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Review of Scientific Instruments Volume 77 Issue 12
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High-reflectivity Cr / Sc multilayer condenser for compact soft x-ray microscopy
Yulin, S.; Takman, P.; Hertz, H.
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American Institute of Physics – Dec 1, 2006 -
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Minimizing image-processing artifacts in scanning tunneling microscopy using linear-regression fitting
Fogarty, Daniel; Deering, Amanda; Guo, Song; Wei, Zhongqing; Kautz, Natalie
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American Institute of Physics – Dec 1, 2006 -
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New diamond anvil cell system for in situ resistance measurement under extreme conditions
Li, Ming; Ma, Yanzhang; Li, Yanchun; Li, Xiaodong; Li, Hui; Liu, Jing; Hao, Aimin; He, Chunyuan; Huang, Xiaowei; Zhang, Dongmei; Yu, Cuiling
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American Institute of Physics – Dec 1, 2006 -
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Development of a pulsed-biasing system and temperature measurement techniques for transient heating experiments on plasma-material interactions
Hanna, J.; Doerner, R.; Hernandez, R.; Seraydarian, R.; Pugno, R.
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American Institute of Physics – Dec 1, 2006 -
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Room-temperature tunnel current amplifier and experimental setup for high resolution electronic spectroscopy in millikelvin scanning tunneling microscope experiments
le Sueur, Hélène; Joyez, Philippe
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American Institute of Physics – Dec 1, 2006 -
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An oscillating coil system for contactless electrical conductivity measurements of aerodynamically levitated melts
Skinner, Lawrie
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American Institute of Physics – Dec 1, 2006 -
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Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification
Suter, R.; Hennessy, D.; Xiao, C.; Lienert, U.
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American Institute of Physics – Dec 1, 2006 -
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Phase modulation atomic force microscope with true atomic resolution
Kilpatrick, Jason; Jarvis, Suzanne
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Design and construction of a compact vacuum furnace for scientific research
Wang, David
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Compatible operation of the power system for steady state and pulse modes in a magnetic torus KT-5D
Wang, Zhi-jiang; Xu, Min; Zhu, Zhen-hua; Lu, Rong-hua; Wen, Yi-zhi; Yu, Chang-xuan; Wan, Shu-de; Liu, Wan-dong; Wang, Jun; Xu, Xiao-yuan; Hu, Ling-ying
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American Institute of Physics – Dec 1, 2006
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