Journal of X-Ray Science and Technology Volume 9 Issue 1

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Journal of X-Ray Science and Technology Volume 9 Issue 1

Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography

H.-R. Lee; W. Ellingson

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

The 2D curved crystal Johansson X-ray spectrometer for diagnostics of hot plasmas

Benjamin S. Fraenkel; Manfred Bitter

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Determination of the monoplane 3D system geometry in X-ray imaging guidance

Hangyi Jiang; Hong Liu; Wei R. Chen

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Structure of Sc/Si multilayer mirrors in as-deposited state and after annealing

A.I. Fedorenko; Yu.P. Pershin; O.V. Poltseva; A.G. Ponomarenko; V.S. Sevryukova; D.L. Voronov; E.N. Zubarev

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Some parameter considerations for radiation sources at 11.5 and 13.5 nm

H.-J. Kunze; L. Juschkin; S. Ellwi

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Design of bifunctional XUV multilayer mirrors using a genetic algorithm

Shannon Lunt; R. Steven Turley; David D. Allred

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

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Journal of X-Ray Science and Technology Volume 9 Issue 1

1 - 6 of 6 articles

H.-R. Lee; W. Ellingson

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Benjamin S. Fraenkel; Manfred Bitter

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Hangyi Jiang; Hong Liu; Wei R. Chen

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

A.I. Fedorenko; Yu.P. Pershin; O.V. Poltseva; A.G. Ponomarenko; V.S. Sevryukova; D.L. Voronov; E.N. Zubarev

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

H.-J. Kunze; L. Juschkin; S. Ellwi

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001

Shannon Lunt; R. Steven Turley; David D. Allred

Follow Journal of X-Ray Science and Technology , Volume 9 (1) IOS Press – Jan 1, 2001