Journal of X-Ray Science and Technology Volume 8 Issue 3

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Journal of X-Ray Science and Technology Volume 8 Issue 3

Additional confirmation of action constant for bremsstrahlung from electron-and-nucleus collisions

William Linlor

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Grazing incidence synchrotron X-ray topography as a tool for denuded zone studies of silicon wafers

R. Rantamäki; T. Tuomi; P.J. McNally; J. Curley; A. Danilewsky

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Hard X-ray emission from high intensity short laser pulse produced Al, Mo and Ta plasmas

Ikhlef, A.; Jiang, Z.; Kieffer, J.C.; Krol, A.

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Optimum collimator for proximity X-ray lithography — Theoretical analysis

Igor A. Artioukov; Igor V. Kozhevnikov; Nataliya I. Kozhevnikova

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Computerised tomography performance

Peter Hammersberg

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

X-UV lamellar multilayer amplitude gratings

J.-M. Andr\'e; A. Sammar; R. Barchewitz; C. Bizeuil; P. Stemmler; B. Villette

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

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Journal of X-Ray Science and Technology Volume 8 Issue 3

1 - 6 of 6 articles

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

R. Rantamäki; T. Tuomi; P.J. McNally; J. Curley; A. Danilewsky

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Ikhlef, A.; Jiang, Z.; Kieffer, J.C.; Krol, A.

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Igor A. Artioukov; Igor V. Kozhevnikov; Nataliya I. Kozhevnikova

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998

J.-M. Andr\'e; A. Sammar; R. Barchewitz; C. Bizeuil; P. Stemmler; B. Villette

Follow Journal of X-Ray Science and Technology , Volume 8 (3) IOS Press – Jan 1, 1998