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Applied Physics A: Materials Science Processing Volume 76 Issue 1

2013
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  - Issue 1 (Jan)
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Nonlinear electrical characteristics and dielectric properties of Ca,Ta-doped TiO 2 varistors

W.Y., Wang; D.F., Zhang; T., Xu; Y.P., Xu; T., Zhou; B.Q., Hu; C.Y., Wang; L.S., Wu; X.L., Chen

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003
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Influence of temperature and frequency on the electrical parameters of thermally evaporated metal-free phthalocyanine H 2 Pc thin films

N.M., Amar; A.M., Saleh; R.D., Gould

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Nanotube growth during annealing of mechanically milled Boron

J.D., Fitz Gerald; Y., Chen; M.J., Conway

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Deep UV laser induced fluorescence in fluoride thin films

J., Heber; C., Mühlig; W., Triebel; N., Danz; R., Thielsch; N., Kaiser

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X-ray photoelectron spectroscopy study of magnetic films

G.H., Yu; F.W., Zhu; C.L., Chai

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High dynamic range optical limiting in fullerene doped porous glasses

M.P., Joshi

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Electron momentum density in Cu 0.9 Al 0.1

M., Samsel-Czekała; G., Kontrym-Sznajd; G., Döring; W., Schülke; J., Kwiatkowska; F., Maniawski; S., Kaprzyk; A., Bansil

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003
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Dispersion and alignment of carbon nanotubes in polycarbonate

M., Sennett; E., Welsh; J.B., Wright; W.Z., Li; J.G., Wen; Z.F., Ren

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003
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Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy

S., Myhra

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003
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Interface reactions in (Fe/B) n multilayers: a way to tune from crystalline/amorphous layer sequences to homogeneous amorphous Fe x B 100-x films

R., Steiner; H.-G., Boyen; M., Krieger; A., Plettl; P., Widmayer; P., Ziemann; F., Banhart; R., Kilper; P., Oelhafen

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Applied Physics A: Materials Science Processing Volume 76 Issue 1

Nonlinear electrical characteristics and dielectric properties of Ca,Ta-doped TiO 2 varistors

W.Y., Wang; D.F., Zhang; T., Xu; Y.P., Xu; T., Zhou; B.Q., Hu; C.Y., Wang; L.S., Wu; X.L., Chen

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Influence of temperature and frequency on the electrical parameters of thermally evaporated metal-free phthalocyanine H 2 Pc thin films

N.M., Amar; A.M., Saleh; R.D., Gould

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Nanotube growth during annealing of mechanically milled Boron

J.D., Fitz Gerald; Y., Chen; M.J., Conway

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Deep UV laser induced fluorescence in fluoride thin films

J., Heber; C., Mühlig; W., Triebel; N., Danz; R., Thielsch; N., Kaiser

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

X-ray photoelectron spectroscopy study of magnetic films

G.H., Yu; F.W., Zhu; C.L., Chai

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

High dynamic range optical limiting in fullerene doped porous glasses

M.P., Joshi

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Electron momentum density in Cu 0.9 Al 0.1

M., Samsel-Czekała; G., Kontrym-Sznajd; G., Döring; W., Schülke; J., Kwiatkowska; F., Maniawski; S., Kaprzyk; A., Bansil

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Dispersion and alignment of carbon nanotubes in polycarbonate

M., Sennett; E., Welsh; J.B., Wright; W.Z., Li; J.G., Wen; Z.F., Ren

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Bias-induced spatially resolved growth and removal of Si-oxide by atomic force microscopy

S., Myhra

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Interface reactions in (Fe/B) n multilayers: a way to tune from crystalline/amorphous layer sequences to homogeneous amorphous Fe x B 100-x films

R., Steiner; H.-G., Boyen; M., Krieger; A., Plettl; P., Widmayer; P., Ziemann; F., Banhart; R., Kilper; P., Oelhafen

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

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Applied Physics A: Materials Science Processing Volume 76 Issue 1

1 - 10 of 25 articles

W.Y., Wang; D.F., Zhang; T., Xu; Y.P., Xu; T., Zhou; B.Q., Hu; C.Y., Wang; L.S., Wu; X.L., Chen

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

N.M., Amar; A.M., Saleh; R.D., Gould

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

J.D., Fitz Gerald; Y., Chen; M.J., Conway

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

J., Heber; C., Mühlig; W., Triebel; N., Danz; R., Thielsch; N., Kaiser

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

G.H., Yu; F.W., Zhu; C.L., Chai

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

M., Samsel-Czekała; G., Kontrym-Sznajd; G., Döring; W., Schülke; J., Kwiatkowska; F., Maniawski; S., Kaprzyk; A., Bansil

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

M., Sennett; E., Welsh; J.B., Wright; W.Z., Li; J.G., Wen; Z.F., Ren

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003

R., Steiner; H.-G., Boyen; M., Krieger; A., Plettl; P., Widmayer; P., Ziemann; F., Banhart; R., Kilper; P., Oelhafen

Follow Applied Physics A: Materials Science Processing , Volume 76 (1) Springer Journals – Jan 1, 2003