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Applied Physics A: Materials Science Processing Volume 71 Issue 2

2013
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2012
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2011
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2010
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2009
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2008
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2007
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2005
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2004
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2003
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2002
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2001
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2000
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1999
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  - Issue 1 (Jan)
- Volume 69
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1998
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Wet-etching fabrication of multilayer GaAlAs/GaAs microtips for scanning near-field optical microscopy

S., Khalfallah; C., Gorecki; J., Podlecki; M., Nishioka; H., Kawakatsu; Y., Arakawa

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000
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Impact of the device scaling on the low-frequency noise in n-MOSFETs

H.M., Bu; Y., Shi; X.L., Yuan; Y.D., Zheng; S.H., Gu; H., Majima; H., Ishikuro; T., Hiramoto

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000
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The melt structural characteristics concerning the interfacial reaction in SiC(p)/Al composites

Z., Shi; J.-M., Yang; T., Fan; D., Zhang; R., Wu

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Microstructure and electron emission properties of films prepared from single-wall and multi-wall nanotubes containing powders

O.R., Monteiro; V.P., Mammana; M.C., Salvadori; J.W., Ager III; S., Dimitrijevic

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Investigation on the nonlinear optical properties of the DCNP/PEK-c guest–host polymer films

W., Shi; C., Fang; Z., Xu; Q., Pan; Q., Gu; D., Xu; H., Wei; J., Yu

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000
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Silicon detectors for neutron detection in the presence of high γ-background

D., Sueva; N., Chikov; V., Spassov; E.I., Vapirev; E., Moravska

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The oxidation of gallium nitride epilayers in dry oxygen

P., Chen; R., Zhang; X.F., Xu; Y.G., Zhou; Z.Z., Chen; S.Y., Xie; W.P., Li; Y.D., Zheng

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Recombination in tensile-strained In0.3Ga0.7As quantum well on InP

S., Kalem; H.-C., Kuo; A., Curtis; G., Stillman

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000
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Electrical activation of phosphorus-donors introduced in 6H-SiC by hot-implantation

T., Ohshima; K., Abe; H., Itoh; M., Yoshikawa; K., Kojima; I., Nashiyama; S., Okada

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000
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Surface modification of silica with ultraviolet laser radiation

D.R., Halfpenny; D.M., Kane; R.N., Lamb; B., Gong

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Applied Physics A: Materials Science Processing Volume 71 Issue 2

Wet-etching fabrication of multilayer GaAlAs/GaAs microtips for scanning near-field optical microscopy

S., Khalfallah; C., Gorecki; J., Podlecki; M., Nishioka; H., Kawakatsu; Y., Arakawa

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Impact of the device scaling on the low-frequency noise in n-MOSFETs

H.M., Bu; Y., Shi; X.L., Yuan; Y.D., Zheng; S.H., Gu; H., Majima; H., Ishikuro; T., Hiramoto

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

The melt structural characteristics concerning the interfacial reaction in SiC(p)/Al composites

Z., Shi; J.-M., Yang; T., Fan; D., Zhang; R., Wu

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Microstructure and electron emission properties of films prepared from single-wall and multi-wall nanotubes containing powders

O.R., Monteiro; V.P., Mammana; M.C., Salvadori; J.W., Ager III; S., Dimitrijevic

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Investigation on the nonlinear optical properties of the DCNP/PEK-c guest–host polymer films

W., Shi; C., Fang; Z., Xu; Q., Pan; Q., Gu; D., Xu; H., Wei; J., Yu

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Silicon detectors for neutron detection in the presence of high γ-background

D., Sueva; N., Chikov; V., Spassov; E.I., Vapirev; E., Moravska

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

The oxidation of gallium nitride epilayers in dry oxygen

P., Chen; R., Zhang; X.F., Xu; Y.G., Zhou; Z.Z., Chen; S.Y., Xie; W.P., Li; Y.D., Zheng

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Recombination in tensile-strained In0.3Ga0.7As quantum well on InP

S., Kalem; H.-C., Kuo; A., Curtis; G., Stillman

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Electrical activation of phosphorus-donors introduced in 6H-SiC by hot-implantation

T., Ohshima; K., Abe; H., Itoh; M., Yoshikawa; K., Kojima; I., Nashiyama; S., Okada

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Surface modification of silica with ultraviolet laser radiation

D.R., Halfpenny; D.M., Kane; R.N., Lamb; B., Gong

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

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Applied Physics A: Materials Science Processing Volume 71 Issue 2

1 - 10 of 23 articles

S., Khalfallah; C., Gorecki; J., Podlecki; M., Nishioka; H., Kawakatsu; Y., Arakawa

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

H.M., Bu; Y., Shi; X.L., Yuan; Y.D., Zheng; S.H., Gu; H., Majima; H., Ishikuro; T., Hiramoto

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

Z., Shi; J.-M., Yang; T., Fan; D., Zhang; R., Wu

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

O.R., Monteiro; V.P., Mammana; M.C., Salvadori; J.W., Ager III; S., Dimitrijevic

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

W., Shi; C., Fang; Z., Xu; Q., Pan; Q., Gu; D., Xu; H., Wei; J., Yu

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

D., Sueva; N., Chikov; V., Spassov; E.I., Vapirev; E., Moravska

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

P., Chen; R., Zhang; X.F., Xu; Y.G., Zhou; Z.Z., Chen; S.Y., Xie; W.P., Li; Y.D., Zheng

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

S., Kalem; H.-C., Kuo; A., Curtis; G., Stillman

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

T., Ohshima; K., Abe; H., Itoh; M., Yoshikawa; K., Kojima; I., Nashiyama; S., Okada

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000

D.R., Halfpenny; D.M., Kane; R.N., Lamb; B., Gong

Follow Applied Physics A: Materials Science Processing , Volume 71 (2) Springer Journals – Aug 1, 2000