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ACM Transactions on Design Automation of Electronic Systems (TODAES) Volume 8 Issue 4

2012
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BIST and production testing of ADCs using imprecise stimulus

Parthasarathy, Kumar; Kuyel, Turker; Price, Dana; Jin, Le; Chen, Degang; Geiger, Randall

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003
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SOC test architecture design for efficient utilization of test bandwidth

Goel, Sandeep Kumar; Marinissen, Erik Jan

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A data acquisition methodology for on-chip repair of embedded memories

Niggemeyer, Dirk; Rudnick, Elizabeth M.

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A circuit level fault model for resistive bridges

Li, Zhuo; Lu, Xiang; Qiu, Wangqi; Shi, Weiping; Walker, D. M. H.

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Multimode scan: Test per clock BIST for IP cores

Singh, Adit D.; Seuring, Markus; Gössel, Michael; Sogomonyan, Egor S.

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Testing high-performance pipelined circuits with slow-speed testers

Nummer, Muhammad; Sachdev, Manoj

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Test data compression using dictionaries with selective entries and fixed-length indices

Li, Lei; Chakrabarty, Krishnendu; Touba, Nur A.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003
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Introduction

Rawat, Shishpal; Wunderlich, Hans-Joachim

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003
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Test vector decomposition-based static compaction algorithms for combinational circuits

El-Maleh, Aiman H.; Osais, Yahya E.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003
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A multiple bit upset tolerant SRAM memory

Neuberger, Gustavo; de Lima, Fernanda; Carro, Luigi; Reis, Ricardo

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

ACM Transactions on Design Automation of Electronic Systems (TODAES) Volume 8 Issue 4

BIST and production testing of ADCs using imprecise stimulus

Parthasarathy, Kumar; Kuyel, Turker; Price, Dana; Jin, Le; Chen, Degang; Geiger, Randall

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

SOC test architecture design for efficient utilization of test bandwidth

Goel, Sandeep Kumar; Marinissen, Erik Jan

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

A data acquisition methodology for on-chip repair of embedded memories

Niggemeyer, Dirk; Rudnick, Elizabeth M.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

A circuit level fault model for resistive bridges

Li, Zhuo; Lu, Xiang; Qiu, Wangqi; Shi, Weiping; Walker, D. M. H.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Multimode scan: Test per clock BIST for IP cores

Singh, Adit D.; Seuring, Markus; Gössel, Michael; Sogomonyan, Egor S.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Testing high-performance pipelined circuits with slow-speed testers

Nummer, Muhammad; Sachdev, Manoj

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Test data compression using dictionaries with selective entries and fixed-length indices

Li, Lei; Chakrabarty, Krishnendu; Touba, Nur A.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Introduction

Rawat, Shishpal; Wunderlich, Hans-Joachim

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Test vector decomposition-based static compaction algorithms for combinational circuits

El-Maleh, Aiman H.; Osais, Yahya E.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

A multiple bit upset tolerant SRAM memory

Neuberger, Gustavo; de Lima, Fernanda; Carro, Luigi; Reis, Ricardo

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

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ACM Transactions on Design Automation of Electronic Systems (TODAES) Volume 8 Issue 4

1 - 10 of 11 articles

Parthasarathy, Kumar; Kuyel, Turker; Price, Dana; Jin, Le; Chen, Degang; Geiger, Randall

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Goel, Sandeep Kumar; Marinissen, Erik Jan

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Niggemeyer, Dirk; Rudnick, Elizabeth M.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Li, Zhuo; Lu, Xiang; Qiu, Wangqi; Shi, Weiping; Walker, D. M. H.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Singh, Adit D.; Seuring, Markus; Gössel, Michael; Sogomonyan, Egor S.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Nummer, Muhammad; Sachdev, Manoj

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Li, Lei; Chakrabarty, Krishnendu; Touba, Nur A.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Rawat, Shishpal; Wunderlich, Hans-Joachim

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

El-Maleh, Aiman H.; Osais, Yahya E.

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003

Neuberger, Gustavo; de Lima, Fernanda; Carro, Luigi; Reis, Ricardo

Follow ACM Transactions on Design Automation of Electronic Systems (TODAES) , Volume 8 (4) Association for Computing Machinery – Oct 1, 2003